ADVANCED TESTING & INSTRUMENTATION
Neuromorphic
Chip Analyzer
32-Channel Platform for Neuromorphic Crossbar Array & Energy per Device (ED) Characterization
Characterize neuromorphic devices at fast speeds, characterize multiple devices, apply treatment waveforms to crossbar arrays, measure dynamic resistance and its variance – all from one integrated platform with industry-standard software.
Configurable
Channels
Maximum Output
Voltage
DAC Resolution
Maximum Input
Frequency
Maximum Current Output
per channel
From Single Devices to Crossbar Arrays
One platform for a wide range of research and characterization tasks.
Individual Device Characterization
IV sweeps, pulse/relaxation, endurance tests, and leakage analysis with extreme timing.
Parallel Multi-Device Testing
Configure and control multiple devices in parallel for faster testing and maximum data throughput.
Crossbar Array Characterization
Reads, program and disturb measurements at arbitrary word-lines, periphery response crossbars.
Simultaneous Multi-Device I–V Characterization
in current
Built for Crossbar Experiments
High precision
voltage or current
Low noise measurement
input
High-impedance
voltage read
Each cell (or 32 channels) can be swept (parallel or sequential), pulsed, or read at sub-µs timing precision at up to 10 MHz.
Flexible Signal Generation
- IV sweeps, single or bi-polar pulse testing
- Step or ramp signal application
- µs-level delay & voltage window
- Automated DC & Pulse read operations
nV Software
Intuitive control of the analyzer, results display, and data analysis – all in one.
Learn more about nV SoftwareAutomated Experiments
- Build test routines using visual instrument
- Automate tests across multiple test setups
- Parallel device programming and readout
- Generate comprehensive reports
- Custom device resistor binning
- Wafer device read and test mapping
- Seamless integration with probe systems
Automated Device Characterization
Dynamics
Testing
Analysis
Tests
Curves
Tests
Recovery
Applications
- Non-volatile & RRAM
- Neuromorphic Devices
- Oxide/Resistive Devices
- In-Memory Computing
- Sensor & Multi-Terminal Arrays
Open & Customizable Platform
- Open communication protocol and software architecture
- Fully configurable hardware and standard test
- Seamless integration with probe stations and manufacturing
- Easy integration with laboratory test setups and automation workflows
Technical Specifications
| Output Voltage (DC/Pulse) | 32 | Waveforms | DC, Pulse, Ramp, Triangle, User Sequence |
|---|---|---|---|
| Channel Isolation | 150 Vpp Open / Ground input · 84 V* | Memory Modes | DC and Pulse |
| Max Output Current | 100 mA | Sensing | Voltage or Current (Sense Channel Mode) |
| Output Voltage Resolution | 16-bit | Input Voltage Range | ±10 V (for ±12 Vpp) |
| Minimum Pulse Width | 100 ns pulse generation mode* | Output Impedance | 100 Ω (typical, ±10%) |
| Minimum Pulse-to-Pulse Spacing | 100 ns | PCIe Interface | USB-C |
| Maximum Output Frequency | 10 MHz (per channel)* | Software | nV Software |
* Pulse specification limits are configurable.
Bring Your Device.
We’ll Help You Characterize It.
Talk to an expert and see how nVolts can meet your measurement requirements. Request a demo or consultation and explore the Neuromorphic Chip Analyzer.