Advanced Research Instrumentation
32-Channel Device
Characterization Platform
Programmable signal generation, high-precision current measurement, and a built-in 32-channel tri-state switch matrix for advanced electronic-device research and characterization.
Multi-Function Electrical Characterization
Maximum output voltage
Input/output resolution
Dynamic & Static Analyzer
Open-Source: Fully Accessible Hardware
Key Specifications
32 channel
Tri-state and configurable
Switch Matrix
Built in Array of Relays
Open-source interface
nV Super Application
Lab-view Library
C++, python, etc.
Dual Supply:
AC/Battery Power
40 Vpp
Maximum output voltage
16-bit
DAC output resolution
16-bit
Current-measurement resolution
10 MHz
Maximum pulse frequency
50 mA per channel
Maximum output current
Automatic and manual
Current-range selection
Integrated PID
Temperature control
User-configurable
Digital GPIOs
Flexible Signal Generation
- DC voltage
- Impulse and Pulse Train
- Sinus wave
- Triangle wave
- User define point to point wave
Fully controllable parameters
Applications
Memristor and resistive-switching arrays
Neuromorphic and in-memory computing
Multi-terminal electronic devices
Sensor arrays and in-sensor computing
Automatic electrical characterizations platform
Designed for Neuromorphic and In-Sensor Computing Research
Purpose-Built for Hardware Neuromorphic Devices
This system is specifically designed for the characterization, programming, and driving of hardware neuromorphic devices, including memristors, memristor arrays, and in-sensor computing devices. Unlike many general-purpose measurement instruments, its software architecture, control algorithms, and test procedures are tailored to the specific requirements of neuromorphic and sensor-computing hardware. The platform is also supported by a dedicated datasheet and communication documentation, enabling users to understand the system interface and control structure in detail.
Flexible, Open, and Researcher-Controlled
A key advantage of the system is its flexibility and openness. In addition to the provided graphical software, the hardware can be controlled using user-written software, allowing researchers and developers to implement custom test routines, control algorithms, read/write schemes, and experimental workflows suited to their own requirements. The system supports different connection and stimulation configurations, including series, parallel, and other custom interconnection schemes. Combined with real-time visualization, data recording, and programmable control, these capabilities make the platform particularly suitable for studying electrical behavior, programming characteristics, switching dynamics, sensing-response behavior, and the overall performance of memristors, hardware neuromorphic devices, and in-sensor computing systems.
Built-In Tri-State Switch Matrix
The integrated 32-channel switch matrix enables flexible routing and control without external switching hardware.
- 32 independently configurable channels
- Each channel can operate as programmable voltage output, current-measurement input, or high-impedance (Hi-Z)
- Individual-device and full crossbar-array characterization
- Synchronized multi-channel biasing and measurement
Measurement and Automation
- Real-time monitoring and measurement
- Automated data acquisition and logging
- Result recording and export
- Individual and parallel device characterization
- Crossbar-array validation
- Device programming and Driving
- Built in PID controller
- Fully controllable User define GPIOs
- Programable switchmatrix
nV Software Capabilities
- Array configuration
- Waveform generation
- Measurement and Trigger setting
- A wide range of analyses
- Terminal viewer
- Save recipe and load with one Click!
Open and Customizable Platform
- Open-source software framework
- Fully documented commands and programming datasheets
- Support for custom software and measurement procedures
- Easy integration with existing laboratory equipment and automation workflows
Support: LabView, python, C++,etc
Supported Experiments
Vector-matrix operations
Neuromorphic computing
In-memory computing
Sensor-array characterization
Automated Device Characterization
✓ I–V characteristics
✓ Switching thresholds
✓ Resistance states
✓ Set and reset behavior
✓ Endurance and retention
✓ Cycle-to-cycle variation
✓ Time based measurement
✓ Device-to-device variation
✓ Temperature based measurement
✓ DC SWEEP
✓ AC SWEEP
✓ Frequency Response
✓ User Define Tests
Ready to simplify advanced device characterization?
Talk to our engineering team about your research and multi-device testing needs.