32-Channel Device
Characterization Platform
Programmable signal generation, high-precision current measurement, and a built-in 32-channel tri-state switch matrix for advanced electronic-device research and characterization.
48 Vpp
Maximum output voltage
16-bit
DAC output resolution
16-bit
Current-measurement resolution
10 MHz
Maximum pulse frequency
Key Specifications
48 Vpp
Maximum output voltage
16-bit
DAC output resolution
16-bit
Current-measurement resolution
10 MHz
Maximum pulse frequency
50 mA per channel
Maximum output current
Automatic and manual
Current-range selection
Integrated PID
Temperature control
User-configurable
Digital GPIOs
Flexible Signal Generation
- DC voltage
- Single pulses and pulse trains
- Sine and triangle waveforms
- User-defined voltage sequences
- Automated DC and frequency sweeps
Applications
Memristor and resistive-switching arrays
Neuromorphic and in-memory computing
Multi-terminal electronic devices
Sensor arrays and in-sensor computing
Temperature-dependent device characterization
Built-In Tri-State Switch Matrix
The integrated 32-channel switch matrix enables flexible routing and control without external switching hardware.
- 32 independently configurable channels
- Each channel can operate as programmable voltage output, current-measurement input, or high-impedance (Hi-Z)
- Individual-device and full crossbar-array characterization
- Synchronized multi-channel biasing and measurement
- Parallel device programming and readout
- Vector-matrix and in-memory computing experiments
- Sensor-array characterization and endurance testing
- Automatic isolation of unused crossbar lines using Hi-Z mode
Measurement and Automation
- Real-time monitoring and measurement
- Automated data acquisition and logging
- Result recording and export
- Individual and parallel device characterization
- Crossbar-array validation
- Parallel device programming and readout
- Multi-device endurance testing
nV Software Capabilities
- Channel configuration
- Waveform generation
- Measurement settings
- Test sequences
- Temperature control
- Saved test procedures can be reused and executed automatically with a single click
Open and Customizable Platform
- Open-source software framework and communication protocol
- Fully documented commands and programming datasheets
- Support for custom software and measurement procedures
- Development of custom analysis tools and user interfaces
- Easy integration with existing laboratory equipment and automation workflows
Supported Experiments
Vector-matrix operations
Neuromorphic computing
In-memory computing
Sensor-array characterization
Automated Device Characterization
✓ I–V characteristics
✓ Switching thresholds
✓ Resistance states
✓ Set and reset behavior
✓ Endurance and retention
✓ Cycle-to-cycle variation
✓ Device-to-device variation
Ready to simplify advanced device characterization?
Talk to our engineering team about your research and multi-device testing needs.